Stress Analyzer

Abstract

SPATE 900 Dynamic Stress Analyzer is an acronym for Stress Pattern Analysis by Thermal Emission. It detects stress-induced temperature changes in a structure and indicates the degree of stress. Ometron, Inc.'s SPATE 9000 consists of a scan unit and a data display. The scan unit contains an infrared channel focused on the test structure to collect thermal radiation, and a visual channel used to set up the scan area and interrogate the stress display. Stress data is produced by detecting minute temperature changes, down to one-thousandth of a degree Centigrade, resulting from the application to the structure of dynamic loading. The electronic data processing system correlates the temperature changes with a reference signal to determine stress level.