Total Internal Reflection Tomography (TIRT) for Three-Dimensional Sub-Wavelength Imaging

Abstract

We will present a novel new form of near-field microscopy known as total internal reflection tomography (TIRT), which allows for true three-dimensional sub-wavelength imaging. It is based on recent theoretical advances regarding the fundamental interaction of light with sub-wavelength structures, as well as stable algorithms for the near-field inverse problem. We will discuss its theoretical underpinnings, as well describe current efforts at the NASA Glenn Research Center to implement a TIRT system for biofluid research.