Search NASA⌕ Search

NASA NTRS · 20030093551

Microstructural and Defect Characterization in Ceramic Composites Using an Ultrasonic Guided Wave Scan System

Abstract

In this study, an ultrasonic guided wave scan system was used to characterize various microstructural and flaw conditions in two types of ceramic matrix composites, SiC/SiC and C/SiC. Rather than attempting to isolate specific lamb wave modes to use for characterization (as is desired for many types of guided wave inspection problems), the guided wave scan system utilizes the total (multi-mode) ultrasonic response in its inspection analysis. Several time and frequency-domain parameters are calculated from the ultrasonic guided wave signal at each scan location to form images. Microstructural and defect conditions examined include delamination, density variation, cracking, and pre/ post-infiltration. Results are compared with thermographic imaging methods. Although the guided wave technique is commonly used so scanning can be eliminated, applying the technique in the scanning mode allows a more precise characterization of defect conditions.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Roth, D. J., Cosgriff, L. M., Martin, R. E., Verrilli, M. J., Bhatt, R. T.. 2003-09-01. Microstructural and Defect Characterization in Ceramic Composites Using an Ultrasonic Guided Wave Scan System. https://ntrs.nasa.gov/citations/20030093551

Cite the original work for its findings. Save a collection to share your selection of sources.