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NASA NTRS ยท 20040050582

SiC/SiC Life Modeling at Intermediate Temperatures under NASA UEET

Abstract

Within the NASA UEET program, physics-based residual strength and rupture life models are being developed for a variety of time-temperature-stress-environment conditions for SiC/SiC components such as combustor liners and vanes. During service, a tensile stress condition that could be life-limiting typically occurs on the 'cold side' of these components due to thermal gradients and attachment schemes. An intermediate temperature (600 to 1000 C) stress-rupture model has been developed based on the underlying physical processes, i.e., oxygen penetration through matrix cracks, oxidation of the BN interphase, and subsequent fiber-fiber fusion within crack-bridging tows that eventually fail in time due to time-dependent strength degradation of the weakest fibers. Modifications to the model will be discussed to incorporate different environmental conditions as well as changes in oxidation kinetics due to improved interphase concepts.

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BibTeXRIS

Morscher, Gregory N.. 2003-01-01. SiC/SiC Life Modeling at Intermediate Temperatures under NASA UEET. https://ntrs.nasa.gov/citations/20040050582

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