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NASA NTRS · 20040086802

Single Axis Piezoceramic Gimbal

Abstract

This paper describes the fabrication, testing, and analysis of a single axis piezoceramic gimbal. The fabrication process consists of pre-stressing a piezoceramic wafer using a high-temperature thermoplastic polyimide and a metal foil. The differential thermal expansion between the ceramic and metal induces a curvature. The pre-stressed, curved piezoceramic is mounted on a support mechanism and a mirror is attached to the piezoceramic. A plot of gimbal angle versus applied voltage to the piezoceramic is presented. A finite element analysis of the piezoceramic gimbal is described. The predicted gimbal angle versus applied voltage is compared to experimental results.

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BibTeXRIS

Horner, Garnett, Taleghani, Barmac. 2001-01-01. Single Axis Piezoceramic Gimbal. https://ntrs.nasa.gov/citations/20040086802

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