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NASA NTRS ยท 20040139248

PIE: A Dynamic Failure-Based Technique

Abstract

This paper presents a dynamic technique for statistically estimating three program characteristics that affect a program's computational behavior: (1) the probability that a particular section of a program is executed, (2) the probability that the particular section affects the data state, and (3) the probability that a data state produced by that section has an effect on program output. These three characteristics can be used to predict whether faults are likely to be uncovered by software testing. Index Terms: Software testing, data state, fault, failure, testability. 1 Introduction

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BibTeXRIS

Voas, Jeffrey M.. 1990-01-01. PIE: A Dynamic Failure-Based Technique. https://ntrs.nasa.gov/citations/20040139248

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