NASA NTRS · 20060002696
Advanced Electronics Technologies: Challenges for Radiation Effects Testing, Modeling, and Mitigation
Abstract
Emerging Electronics Technologies include: 1) Changes in the commercial semiconductor world; 2) Radiation Effects Sources (A sample test constraint); and 3) Challenges to Radiation Testing and Modeling: a) IC Attributes-Radiation Effects Implication b) Fault Isolation c) Scaled Geometry d) Speed e) Modeling Shortfall f) Knowledge Status
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LaBel, Kenneth A., Cohn, Lewis M.. 2005-01-01. Advanced Electronics Technologies: Challenges for Radiation Effects Testing, Modeling, and Mitigation. https://ntrs.nasa.gov/citations/20060002696
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