NASA NTRS · 20060028892
Qualification and reliability testing of a microchip laser system for space applications
Abstract
This paper discusses the process being used and the results of the selection and qualification of a low cost prepackaged diode laser with a custom packaged microchip laser crystal.
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Wright, M. W., Franzen, D., Hemmati, H., Sandor, M.. 2003-07-07. Qualification and reliability testing of a microchip laser system for space applications. https://ntrs.nasa.gov/citations/20060028892
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