NASA NTRS · 20060030189
External merology truss technology demonstration (KITE)
Abstract
To achieve micro-arcsecond astrometry, SIM's external metrology system must track the relative changes of three baseline vectors with a precision of tens of picometers over a one-hour time scale.
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Nemati, B.. 2002-08-01. External merology truss technology demonstration (KITE). https://ntrs.nasa.gov/citations/20060030189
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