NASA NTRS · 20060030363
Reliability and endurance of FRAM: a case study
Abstract
This paper describes a case study quantifying reliability and endurance results of two FRAM nonvolatile memories.
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Namkung, J., Patel, J.. 2002-11-04. Reliability and endurance of FRAM: a case study. https://ntrs.nasa.gov/citations/20060030363
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