NASA NTRS · 20060033116
Elemental Surface Analysis at Ambient Pressure
Abstract
The development of a portable surface elemental analysis tool based on the excitation of characteristics x-rays at ambient pressure with an electron beam is described.
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Feldman, J., Wilcox, J., George, T., Barsic, D., Scherer, A.. 2000-01-01. Elemental Surface Analysis at Ambient Pressure. https://ntrs.nasa.gov/citations/20060033116
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