NASA NTRS · 20060035405
Total Ionizing Dose Effects on 64Mb 3.3V DRAMs
Abstract
64Mb 3.3V CMOS DRAMs from two different manufacturers were tested for total dose. Retention time, power supply current, and functionality were used to characterize device response.
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Johnston, A. H., Lee, C. I.. 1997-07-21. Total Ionizing Dose Effects on 64Mb 3.3V DRAMs. https://ntrs.nasa.gov/citations/20060035405
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