NASA NTRS · 20060036383
Hardness Assurance Techniques for New Generation COTS Devices
Abstract
Hardness Assurance (HA) techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed significant degradation at HDR, not at low dose rate environment. New generation low-power op amps showed more degradation at low voltage applications. HA test techniques for COTS devices are presented in this paper.
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Lee, C. I., Rax, B. G., Johnston, A. H.. 1996-07-15. Hardness Assurance Techniques for New Generation COTS Devices. https://ntrs.nasa.gov/citations/20060036383
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