Decay Method for Measuring Complex Dielectric Constants During Microwave Processing

Iny, O.; Barnatz, M.

NASA NTRS · 20060039598

Decay Method for Measuring Complex Dielectric Constants During Microwave Processing

Iny, O.·Barnatz, M.

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microwaves microwave resonant mode dielectric constants

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Iny, O., Barnatz, M.. 1994-04-04. Decay Method for Measuring Complex Dielectric Constants During Microwave Processing. https://ntrs.nasa.gov/citations/20060039598

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