NASA NTRS · 20060040612
Target Calibration: Retro-Reflection Mechnisms at 2 Microns
Abstract
There is increased interest in the reflectance properties of hard target calibration materials at this wavelength.
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Tratt, D., Haner, D.. 1999-06-28. Target Calibration: Retro-Reflection Mechnisms at 2 Microns. https://ntrs.nasa.gov/citations/20060040612
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