Proton Damage Effects in Linear Integrated Circuts

Rax, B.; Johnston, A.; Lee, C.

NASA NTRS · 20060041417

Proton Damage Effects in Linear Integrated Circuts

Abstract

Proton testing of linear circuits has identified devices where significantly more damage occurs at equivalent total dose levels with protons than tests with gamma rays.

Explore related subjects

lateral pnp transistors proton damage effects linear integrated circuits gamma rays ionization MOS radiation levels

Keep this discovery

Explore connections, maps & timelines

BibTeX RIS

Rax, B., Johnston, A., Lee, C.. 1998-07-20. Proton Damage Effects in Linear Integrated Circuts. https://ntrs.nasa.gov/citations/20060041417

Cite the original work for its findings. Save a collection to share your selection of sources.