NASA NTRS · 20060048506
Electronics Shielding and Reliability Design Tools
Abstract
It is well known that electronics placement in large-scale human-rated systems provides opportunity to optimize electronics shielding through materials choice and geometric arrangement. For example, several hundred single event upsets (SEUs) occur within the Shuttle avionic computers during a typical mission. An order of magnitude larger SEU rate would occur without careful placement in the Shuttle design. These results used basic physics models (linear energy transfer (LET), track structure, Auger recombination) combined with limited SEU cross section measurements allowing accurate evaluation of target fragment contributions to Shuttle avionics memory upsets. Electronics shielding design on human-rated systems provides opportunity to minimize radiation impact on critical and non-critical electronic systems. Implementation of shielding design tools requires adequate methods for evaluation of design layouts, guiding qualification testing, and an adequate follow-up on final design evaluation including results from a systems/device testing program tailored to meet design requirements.
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Wilson, John W., ONeill, P. M., Zang, Thomas A., Jr., Pandolf, John E., Koontz, Steven L., Boeder, P., Reddell, B., Pankop, C.. 2006-01-01. Electronics Shielding and Reliability Design Tools. https://ntrs.nasa.gov/citations/20060048506
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