Electron-Induced Displacement Damage Effects in CCDs

Becker, Heidi N.; Elliott, Tom; Alexander, James W.

NASA NTRS · 20070011687

Electron-Induced Displacement Damage Effects in CCDs

Becker, Heidi N.·Elliott, Tom·Alexander, James W.

Abstract

We compare differences in parametric degradation for CCDs irradiated to the same displacement damage dose with 10-MeV and 50-MeV electrons. Charge transfer efficiency degradation was observed to not scale with NIEL for small signals.

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BibTeX RIS

Becker, Heidi N., Elliott, Tom, Alexander, James W.. 2006-07-17. Electron-Induced Displacement Damage Effects in CCDs. https://ntrs.nasa.gov/citations/20070011687

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