NASA NTRS · 20070019369
SEU Performance of TAG Based Flip Flops
Abstract
We describe heavy ion test results for two new SEU tolerant latches based on transition nand gates, one for single rail asynchronous and the other for dual rail synchronous designs, implemented in AMI 0.5microprocess.
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Shuler, Robert L., Kouba, Coy, O'Neill, Patrick M.. 2005-01-01. SEU Performance of TAG Based Flip Flops. https://ntrs.nasa.gov/citations/20070019369
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