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NASA NTRS · 20070023697

Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors

Irom, Frokh·Farmanesh, Farhad F.·Swift, Gary M.·Johnston, Allen H.
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Abstract

This paper examines single-event upsets in advanced commercial SOI microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency. Results are presented for SOI processors with feature sizes of 0.18 microns and two different core voltages. Single-event upset from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequency up to 1GHz. Frequency and core voltage dependence of single-event upsets in registers is discussed.

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Irom, Frokh, Farmanesh, Farhad F., Swift, Gary M., Johnston, Allen H.. 2004-07-19. Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors. https://ntrs.nasa.gov/citations/20070023697

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