Error Analysis for High Resolution Topography with Bi-Static Single-Pass SAR Interferometry

Muellerschoen, Ronald J.; Chen, Curtis W.; Hensley, Scott; Rodriguez, Ernesto

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NASA NTRS · 20070030942

Error Analysis for High Resolution Topography with Bi-Static Single-Pass SAR Interferometry

Muellerschoen, Ronald J.·Chen, Curtis W.·Hensley, Scott·Rodriguez, Ernesto

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Abstract

We present a flow down error analysis from the radar system to topographic height errors for bi-static single pass SAR interferometry for a satellite tandem pair. Because of orbital dynamics the baseline length and baseline orientation evolve spatially and temporally, the height accuracy of the system is modeled as a function of the spacecraft position and ground location. Vector sensitivity equations of height and the planar error components due to metrology, media effects, and radar system errors are derived and evaluated globally for a baseline mission. Included in the model are terrain effects that contribute to layover and shadow and slope effects on height errors. The analysis also accounts for nonoverlapping spectra and the non-overlapping bandwidth due to differences between the two platforms' viewing geometries. The model is applied to a 514 km altitude 97.4 degree inclination tandem satellite mission with a 300 m baseline separation and X-band SAR. Results from our model indicate that global DTED level 3 can be achieved.

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BibTeX RIS

Muellerschoen, Ronald J., Chen, Curtis W., Hensley, Scott, Rodriguez, Ernesto. 2006-04-24. Error Analysis for High Resolution Topography with Bi-Static Single-Pass SAR Interferometry. https://ntrs.nasa.gov/citations/20070030942

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