Zernike-like Orthogonal Basis Functions for Wavefront Characterization over Sampled, Irregular Apertures

Abstract

For optical systems with circular apertures, wavefronts are often analyzed using Zernike polynomials, and individual Zernike functions are associated with familiar optical aberrations. For systems with noncircular apertures, or in practical situations in which wavefronts are measured at a limited number of points in the aperture, the Zernike polynomials are no longer an orthogonal basis for the measured data. Although there are an endless number of ways to create a basis for such measured data, a "Zernike-like" basis is useful to connect with our experience with the usual optical aberrations. In this paper, the steps required to identify a Zernike-like basis for wavefronts over sampled, irregular apertures are presented, based on the Gram-Schmidt orthogonalization technique. The benefits of analyzing optical wavefronts using an orthogonal basis specific to an optical system's aperture shape and wavefront sampling, instead of using the traditional Zernike polynomials, are detailed in two examples, from image-based wavefront sensing on a segmented-aperture telescope (the James Webb Space Telescope Testbed Telescope at Ball Aerospace) and from interferometer characterization for surface metrology of a hexagonal mirror segment.