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NASA NTRS ยท 20080004128

Frequency scanning capaciflector for capacitively determining the material properties

Abstract

A capaciflector sensor system scanned in frequency is used to detect the permittivity of the material of an object being sensed. A capaciflector sensor element, coupled to current-measuring voltage follower circuitry, is driven by a frequency swept oscillator and generates an output which corresponds to capacity as a function of the input frequency. This swept frequency information is fed into apparatus e.g. a digital computer for comparing the shape of the capacitance vs. frequency curve against characteristic capacitor vs. frequency curves for a variety of different materials which are stored, for example, in a digital memory of the computer or a database. Using a technique of pattern matching, a determination is made as to the identification of the material. Also, when desirable, the distance between the sensor and the object can be determined.

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BibTeXRIS

Campbell, Charles E.. 1996-05-28. Frequency scanning capaciflector for capacitively determining the material properties. https://ntrs.nasa.gov/citations/20080004128

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