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NASA NTRS ยท 20080040687

Failures in Hybrid Microcircuits During Environmental Testing. History Cases

Abstract

This purpose of this viewgraph presentation is to discuss failures in hermetic hybrids observed at the GSFC PA Lab during environmental stress testing. The cases discussed are: Case I. Substrate metallization failures during Thermal cycling (TC). Case II. Flex lid-induced failure. Case Ill. Hermeticity failures during TC. Case IV. Die metallization cracking during TC. and how many test cycles and parts is necessary? Case V. Wire Bond failures after life test. Case VI. Failures caused by Au/In IMC growth.

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BibTeXRIS

Teverovsky, Alexander. 2008-02-11. Failures in Hybrid Microcircuits During Environmental Testing. History Cases. https://ntrs.nasa.gov/citations/20080040687

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