NASA NTRS · 20100031304
Performance of Planar-Waveguide External Cavity Laser for Precision Measurements
Abstract
A 1542-nm planar-waveguide external cavity laser (PW-ECL) is shown to have a sufficiently low level of frequency and intensity noise to be suitable for precision measurement applications. The frequency noise and intensity noise of the PW-ECL was comparable or better than the nonplanar ring oscillator (NPRO) and fiber laser between 0.1 mHz to 100 kHz. Controllability of the PW-ECL was demonstrated by stabilizing its frequency to acetylene (13C2H2) at 10(exp -13) level of Allan deviation. The PW-ECL also has the advantage of the compactness of a standard butterfly package, low cost, and a simple design consisting of a semiconductor gain media coupled to a planar-waveguide Bragg reflector. These features would make the PW-ECL suitable for precision measurements, including compact optical frequency standards, space lidar, and space interferometry
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Numata, Kenji, Camp, Jordan, Krainak, Michael A., Stolpner, Lew. 2010-01-01. Performance of Planar-Waveguide External Cavity Laser for Precision Measurements. https://ntrs.nasa.gov/citations/20100031304
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