Search NASA⌕ Search

NASA NTRS · 20100040652

Determining the Differential Emission Measure from EIS, XRT, and AIA

Abstract

This viewgraph presentation determines the Differential Emission Measure (DEM) from the EUV Imaging Spectrometer (EIS), X Ray Telescope (XRT), and Atmospheric Imaging Array (AIA). Common observations with Fe, Si, and Ca EIS lines are shown along with observations with Al-mesh, Ti-poly Al-thick and Be-thick XRT filters. Results from these observations are shown to determine what lines and filters are important to better constrain the hot component.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Winebarger, Amy R., Warren, H.P., Schmelz, J.. 2010-10-11. Determining the Differential Emission Measure from EIS, XRT, and AIA. https://ntrs.nasa.gov/citations/20100040652

Cite the original work for its findings. Save a collection to share your selection of sources.