Wire Test Grip Fixture

Abstract

Wire-testing issues, such as the gripping strains imposed on the wire, play a critical role in obtaining clean data. In a standard test frame fitted with flat wedge grips, the gripping action alone creates stresses on the wire specimen that cause the wire to fail at the grip location. A new test frame, which is outfitted with a vacuum chamber, negated the use of any conventional commercially available wire test fixtures, as only 7 in. (17.8 cm) existed between the grip faces. An innovative grip fixture was designed to test thin gauge wire for a variety of applications in an existing Instron test frame outfitted with a vacuum chamber.