NASA NTRS · 20110008328
Defect Depth Measurement Using White Light Interferometry
Abstract
The objectives of the White Light Interferometry project are the following: (1) Demonstrate a small hand-held instrument capable of performing inspections of identified defects on Orbiter outer pane window surfaces. (2) Build and field-test a prototype device using miniaturized optical components. (3) Modify the instrument based on field testing and begin the conversion of the unit to become a certified shop-aid.
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Parker, Don, Starr, Stan. 2009-01-01. Defect Depth Measurement Using White Light Interferometry. https://ntrs.nasa.gov/citations/20110008328
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