NASA NTRS · 20110015296
Humidity Steady State Low Voltage Testing of MLCCs (Based on NESC Technical Assessment Report)
Abstract
Review of the low voltage reduced Insulation Resistance (IR) failure phenomenon in Multilayer ceramic capacitors (MLCCs)and NASA approaches to contend with this risk. 1. Analyze published materials on root cause mechanisms. 2. Investigate suitability of current test methods to assess MLCC lots for susceptibility. 3. Review current NASA parts selection and application guidelines in consideration of benefits vs. disadvantages.
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Sampson, Mike, Brusse, Jay, Teverovsky, Alexander. 2011-03-28. Humidity Steady State Low Voltage Testing of MLCCs (Based on NESC Technical Assessment Report). https://ntrs.nasa.gov/citations/20110015296
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