NASA NTRS · 20110015449
Statistical Techniques for Analyzing Process or "Similarity" Data in TID Hardness Assurance
Abstract
We investigate techniques for estimating the contributions to TID hardness variability for families of linear bipolar technologies, determining how part-to-part and lot-to-lot variability change for different part types in the process.
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Ladbury, R.. 2010-07-19. Statistical Techniques for Analyzing Process or "Similarity" Data in TID Hardness Assurance. https://ntrs.nasa.gov/citations/20110015449
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