NASA NTRS · 20120006117
Validation of a Crystal Plasticity Model Using High Energy Diffraction Microscopy
Abstract
High energy diffraction microscopy is used to measure the crystallographic orientation and evolution of lattice strain in an Al Li alloy. The relative spatial arrangement of the several pancake-shaped grains in a tensile sample is determined through in situ and ex situ techniques. A model for crystal plasticity with continuity of lattice spin is posed, where grains are represented by layers in a finite element mesh following the arrangement indicated by experiment. Comparison is drawn between experiment and simulation.
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Beaudoin, A. J., Obstalecki, M., Storer, R., Tayon, W., Mach, J., Kenesei, P., Lienert, U.. 2012-03-09. Validation of a Crystal Plasticity Model Using High Energy Diffraction Microscopy. https://ntrs.nasa.gov/citations/20120006117
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