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NASA NTRS · 20120013528

GaN-Based High Temperature and Radiation-Hard Electronics for Harsh Environments

Abstract

We develop novel GaN-based high temperature and radiation-hard electronics to realize data acquisition electronics and transmitters suitable for operations in harsh planetary environments. In this paper, we discuss our research on metal-oxide-semiconductor (MOS) transistors that are targeted for 500 (sup o)C operation and >2 Mrad radiation hardness. For the target device performance, we develop Schottky-free AlGaN/GaN MOS transistors, where a gate electrode is processed in a MOS layout using an Al2O3 gate dielectric layer....

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BibTeXRIS

Son, Kyung-ah, Liao, Anna, Lung, Gerald, Gallegos, Manuel, Hatakeh, Toshiro, Harris, Richard D., Scheick, Leif Z., Smythe, William D.. 2010-04-07. GaN-Based High Temperature and Radiation-Hard Electronics for Harsh Environments. https://ntrs.nasa.gov/citations/20120013528

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