NASA NTRS · 20140011872
Development of New Dielectric NDE Techniques for Spaceflight Materials
Abstract
Dielectric Spectroscopy is a relatively new technique for non-destructively measuring material properties. The goal for this project is to extend the use of state-of-the-art dielectric spectroscopy systems to measure the spectra of spaceflight materials and develop non-destructive evaluation (NDE) sensors based on dielectric material properties. This work may lead to a new class of material density, moisture, temperature, and defect sensors providing structural integrity and health measurements for future spacecraft and launch structures.
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Nurge, Mark A.. 2014-06-13. Development of New Dielectric NDE Techniques for Spaceflight Materials. https://ntrs.nasa.gov/citations/20140011872
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