Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

LaBel, Kenneth A.; Berg, Melanie D.

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NASA NTRS · 20150004129

Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

LaBel, Kenneth A.·Berg, Melanie D.

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Abstract

Electronic parts (integrated circuits) have grown in complexity such that determining all failure modes and risks from single particle event testing is impossible. In this presentation, the authors will present why this is so and provide some realism on what this means. Its all about understanding actual risks and not making assumptions.

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NASA Electronic Parts and Packaging (NEPP) Program Parts Assurance Technology Evaluation

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LaBel, Kenneth A., Berg, Melanie D.. 2015-03-23. Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof. https://ntrs.nasa.gov/citations/20150004129

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