Alignment and Characterization of High Uniformity Imaging Spectrometers

Abstract

Imaging spectrometers require precise adjustments, in some cases at the sub-micrometer level, in order to achieve auniform response over both the spectral and spatial dimensions. We describe a set of measurement techniques and theircorresponding alignment adjustments to achieve the 95% or higher uniformity specifications required for Earthobservingimaging spectrometers. The methods are illustrated with measurements from the Next Generation Imaging Spectrometer system that has been built at the Jet Propulsion Laboratory, California Institute of Technology, under contract with the National Aeronautics and Space Administration.