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NASA NTRS · 20150006909

Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen

Pease, Ronald L.·Adell, Philippe C.·Rax, Bernard·McClure, Steven·Barnaby, Hugh J.·Kruckmeyer, Kirby·Triggs, B.
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Abstract

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened "ELDRS-free" part types have been tested using this same approach to see if the test is overly conservative.

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radiation effectshydrogentotal ionizing dosedose rateenhanced low-dose rate sensitivity (ELDRS)bipolar linear circuits

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Pease, Ronald L., Adell, Philippe C., Rax, Bernard, McClure, Steven, Barnaby, Hugh J., Kruckmeyer, Kirby, Triggs, B.. 2011-07-25. Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen. https://ntrs.nasa.gov/citations/20150006909

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