Search NASAโŒ• Search

NASA NTRS ยท 20150021448

Marking Tests to Certify Part Identification Processes for Use in Low Earth Orbit

Abstract

The primary purpose for the MISSE marking tests was to define Data Matrix symbol marking processes that will remain readable after exposure to Low Earth Orbit environments. A wide range of different Data Matrix symbol marking processes and materials, including some still under development, were evaluated. The samples flown on MISSE 1 and 2 were in orbit for 3 years and 348 days, MISSE 3 and 4 were in orbit for 1 year and 15 days, MISSE 6 was in orbit for 1 year and 130 days, and MISSE 8 was in orbit for 2 years and 55 days. The initial MISSE marking tests clearly reflected that intrusive marking processes can be successfully used for this purpose. All of the intrusive marking processes tested exceeded program expectations and met 100 percent of the principle investigators objectives. However, subsequent tests demonstrated that some additive marking processes will also satisfy the requirements. This was an unexpected result.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Roxby, D. L.. 2015-10-01. Marking Tests to Certify Part Identification Processes for Use in Low Earth Orbit. https://ntrs.nasa.gov/citations/20150021448

Cite the original work for its findings. Save a collection to share your selection of sources.