NASA NTRS · 20160000951
Schottky Diode Derating for Survivability in a Heavy Ion Environment
Abstract
The dependence of single-event failures in Schottky diodes on reverse voltage derating is discussed. Failure location and possible mechanisms are also discussed.
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Casey, Megan C., Lauenstein, Jean-Marie, Ladbury, Raymond L., Wilcox, Edward P., Topper, Alyson D., LaBel, Kenneth A.. 2016-01-13. Schottky Diode Derating for Survivability in a Heavy Ion Environment. https://ntrs.nasa.gov/citations/20160000951
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