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NASA NTRS ยท 20160005085

Theoretical Accuracy for ESTL Bit Error Rate Tests

Abstract

"Bit error rate" [BER] for the purposes of this paper is the fraction of binary bits which are inverted by passage through a communication system. BER can be measured for a block of sample bits by comparing a received block with the transmitted block and counting the erroneous bits. Bit Error Rate [BER] tests are the most common type of test used by the ESTL for evaluating system-level performance. The resolution of the test is obvious: the measurement cannot be resolved more finely than 1/N, the number of bits tested. The tolerance is not. This paper examines the measurement accuracy of the bit error rate test. It is intended that this information will be useful in analyzing data taken in the ESTL. This paper is divided into four sections and follows a logically ordered presentation, with results developed before they are evaluated. However, first-time readers will derive the greatest benefit from this paper by skipping the lengthy section devoted to analysis, and treating it as reference material. The analysis performed in this paper is based on a Probability Density Function [PDF] which is developed with greater detail in a past paper, Theoretical Accuracy for ESTL Probability of Acquisition Tests, EV4-98-609.

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BibTeXRIS

Lansdowne, Chatwin. 1998-09-01. Theoretical Accuracy for ESTL Bit Error Rate Tests. https://ntrs.nasa.gov/citations/20160005085

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