NASA NTRS · 20160008697
Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data
Abstract
This is a NASA Electronics Parts and Packaging (NEPP) independent investigation to determine the single event destructive and transient susceptibility of the Microsemi RTG4 device (DUT).
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Berg, Melanie, Kim, Hak, Phan, Anthony, Seidleck, Christina, LaBel, Ken. 2016-06-26. Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data. https://ntrs.nasa.gov/citations/20160008697
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