NASA NTRS · 20160008885
By-Pass Diode Temperature Tests of a Solar Array Coupon under Space Thermal Environment Conditions
Abstract
By-Pass diodes are a key design feature of solar arrays and system design must be robust against local heating, especially with implementation of larger solar cells. By-Pass diode testing was performed to aid thermal model development for use in future array designs that utilize larger cell sizes that result in higher string currents. Testing was performed on a 56-cell Advanced Triple Junction solar array coupon provided by SSL. Test conditions were vacuum with cold array backside using discrete by-pass diode current steps of 0.25 A ranging from 0 A to 2.0 A.
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Wright, Kenneth H., Schneider, Todd A., Vaughn, Jason A., Hoang, Bao, Wong, Frankie, Wu, Gordon. 2016-06-05. By-Pass Diode Temperature Tests of a Solar Array Coupon under Space Thermal Environment Conditions. https://ntrs.nasa.gov/citations/20160008885
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