NASA NTRS · 20170002430
Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data
Abstract
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.
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Berg, Melanie, Label, Kenneth, Campola, Michael, Xapsos, Michael. 2017-03-20. Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data. https://ntrs.nasa.gov/citations/20170002430
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