Characterization of System Level Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

Berg, Melanie; Label, Kenneth; Campola, Michael; Xapsos, Michael

NASA NTRS · 20170005807

Characterization of System Level Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

Berg, Melanie·Label, Kenneth·Campola, Michael·Xapsos, Michael

Abstract

We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.

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Field Programmable Gate Array (FPGA); Application Specific Integrated Circuit (A

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BibTeX RIS

Berg, Melanie, Label, Kenneth, Campola, Michael, Xapsos, Michael. 2017-06-26. Characterization of System Level Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data. https://ntrs.nasa.gov/citations/20170005807

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