NASA NTRS · 20170007321
An Improved SEL Test of the ADV212 Video Codec
Abstract
Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latch-up (SEL) protection circuitry.
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Wilcox, Edward P., Campola, Michael J., Nadendla, Seshagiri, Kadari, Madhusudhan, Gigliuto, Robert A.. 2017-07-17. An Improved SEL Test of the ADV212 Video Codec. https://ntrs.nasa.gov/citations/20170007321
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