Hardware Demonstration: Frequency Spectra of Transients

McCloskey, John; Dimov, Jen

Home/Archive/NASA NTRS

NASA NTRS · 20170007497

Hardware Demonstration: Frequency Spectra of Transients

McCloskey, John·Dimov, Jen

View original source ↗Export metadata ↓

Abstract

Radiated emissions measurements as specified by MIL-STD-461 are performed in the frequency domain, which is best suited to continuous wave (CW) types of signals. However, many platforms implement signals that are single event pulses or transients. Such signals can potentially generate momentary radiated emissions that can cause interference in the system, but they may be missed with traditional measurement techniques. This demonstration provides measurement and analysis techniques that effectively evaluate the potential emissions from such signals in order to evaluate their potential impacts to system performance.

Explore related subjects

EMI EMC

Keep this discovery

Explore connections, maps & timelines

BibTeX RIS

McCloskey, John, Dimov, Jen. 2017-08-09. Hardware Demonstration: Frequency Spectra of Transients. https://ntrs.nasa.gov/citations/20170007497

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

DOE OSTI2024

State-of-the-Art Medium- and High-Voltage Silicon Carbide Power Modules, Challenges and Mitigation Techniques: A Review

Silicon carbide (SiC) power modules have been demonstrated potential for improving power density and efficiency for low-voltage power electronics systems. This has resulted in a paradigm shift toward development of medium-voltage and high-voltage (MV/HV) SiC power modules to revolutionize the future power grid and transportation systems. However, designing MV/HV SiC power modules involves significant design challenges due to higher blocking voltage and exacerbation of side effects due to high switching dv/dt and di/dt of SiC devices-concerns that may not be as critical as in low-voltage module development. This article reviews the development of state-of-the-art MV/HV SiC power modules, ranging from 3.3 kV to 40 kV, from both industry and academia. First, a discussion on SiC modules based on voltage level is presented. This is followed by a discussion of challenges associated with designing and testing MV/HV modules- including parasitic controls, electromagnetic interference (EMI), partial discharge, and thermal management-and the corresponding mitigation approaches from various perspectives. We conclude with a summary of major findings and future directions for the development of MV/HV modules.

EMI↗

NASA NTRS2019

Integration and Test (I&T) Horror Stories and the Lessons Learned

I've been asked to be a presenter along with a panel of fellow NASA Electromagnetic Compatibility (EMC) engineers at this year's IEEE EMC & Signal and Power Integrity (SIPI) 2019 symposium. The topic I am asked to cover is in regards to I&T horror stories because of my 15 years of personal experience as an EMC test engineer with Code 549. I am planning on only having slides with photos of test methods we no longer use as well as cover some mishaps that have happened over the years both within my organization and throughout the space industry. Highlighting the mistakes that were made, the lessons learned from those incidents and how they've effected how we test today.

EMI↗