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NASA NTRS · 20170009001

Micron MT29F128G08AJAAA 128GB Asynchronous Flash Memory Total Ionizing Dose Characterization Test Report

Campola, Michael·Wyrwas, Edward
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Abstract

The purpose of this test was to characterize the Micron MT29F128G08AJAAAs parameter degradation for total dose response and to evaluate and compare lot date codes for sensitivity. In the test, the device was exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits and overall chip and die health were investigated to determine which lot is more robust.

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Flash Memoryblock errorstotal ionizing dose (TID)

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BibTeXRIS

Campola, Michael, Wyrwas, Edward. 2017-04-11. Micron MT29F128G08AJAAA 128GB Asynchronous Flash Memory Total Ionizing Dose Characterization Test Report. https://ntrs.nasa.gov/citations/20170009001

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