NASA NTRS · 20170012420
Field Programmable Gate Array Failure Rate Estimation Guidelines for Launch Vehicle Fault Tree Models
Abstract
Today's launch vehicles complex electronic and avionics systems heavily utilize Field Programmable Gate Array (FPGA) integrated circuits (IC) for their superb speed and reconfiguration capabilities. Consequently, FPGAs are prevalent ICs in communication protocols such as MILSTD- 1553B and in control signal commands such as in solenoid valve actuations. This paper will identify reliability concerns and high level guidelines to estimate FPGA total failure rates in a launch vehicle application. The paper will discuss hardware, hardware description language, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC. The hardware description language portion will discuss the high level FPGA programming languages and software/code reliability growth. The radiation portion will discuss FPGA susceptibility to space environment radiation.
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Al Hassan, Mohammad, Britton, Paul, Hatfield, Glen Spencer, Novack, Steven D.. 2017-10-18. Field Programmable Gate Array Failure Rate Estimation Guidelines for Launch Vehicle Fault Tree Models. https://ntrs.nasa.gov/citations/20170012420
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