NASA NTRS · 20190000638
Evaluation of System Reliability and Heavy Ion Angular Effects
Abstract
Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data is presented. SEU data analysis includes: 1) Evaluation of heavy-ion beam angular effects (rectangular parallel pipe (RPP) or no RPP), 2) Importance of finding linear energy transfer (LET) onset (L0), 3) Comparison of prediction rate techniques.
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Berg, Melanie, Campola, Michael. 2019-02-05. Evaluation of System Reliability and Heavy Ion Angular Effects. https://ntrs.nasa.gov/citations/20190000638
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