Uncertainty Quantification of Modeled Electron Backstreaming Failure for the NEXT Ion Thruster

Abstract

Excessive electron back streaming is one of the primary life-limiting failure modes for gridded ion thrusters. Physics-based modeling of the optics grid erosion and electron back streaming margins is augmented with statistical uncertainty quantification techniques to generate a life expectancy distribution of this particular failure mechanism for the NEXT ion thruster. Generation of distributions instead of a single point estimate provide a more comprehensive picture of thruster failure probabilities and life expectation for various mission applications.