NASA NTRS · 20200001205
OMH3075 Hall Effect Sensor Total Ionizing Dose Test Report
Abstract
The purpose of this test was to characterize the OMH3075 Hall Effects sensor degradation for total dose response. The device samples were exposed to low dose irradiations using gamma radiation. Device parameters such as magnetic operating points, leakage currents, supply currents, and rise and fall times were investigated.
Keep this discovery
Explore connections, maps & timelines
Forney, James, Campola, Michael. 2019-08-19. OMH3075 Hall Effect Sensor Total Ionizing Dose Test Report. https://ntrs.nasa.gov/citations/20200001205
Cite the original work for its findings. Save a collection to share your selection of sources.